OMI Colloquium | Electrical and Chemical Imaging on the nm-scale, Sept. 27
The Ohio Materials Institute Colloquium Series presents Anne D. Müller of Anfatec Instruments AG, on “Electrical and Chemical Imaging on the nm-scale”, on Thursday, Sept. 27, at 4:10 p.m. in Clippinger Labs 194. Abstract: I will explain the side-band detection in atomic force microscopy and how it is used to […]
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