The Ohio Materials Institute Colloquium Series presents Anne D. Müller of Anfatec Instruments AG, on “Electrical and Chemical Imaging on the nm-scale”, on Thursday, Sept. 27, at 4:10 p.m. in Clippinger Labs 194.
30nm Gold Clusters
Abstract: I will explain the side-band detection in atomic force microscopy and how it is used to derive additional physical information from a sample surface by either Kelvin-probe Force Microscopy (electrical information) or Photo-Induced Force Microscopy (chemical information similar to IR spectroscopy).
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